ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,591, issued on April 21, was assigned to ACCENTURE GLOBAL SOLUTIONS Ltd. (Dublin). "Deep learning models processing time series data" was ... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,593, issued on April 21, was assigned to Snap Inc. (Santa Monica, Calif.). "Compressing image-to-image models" was invented by Jian Ren (M... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,594, issued on April 21, was assigned to GOOGLE LLC (Mountain View, Calif.). "Machine-learned attention models featuring omnidirectional p... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,595, issued on April 21, was assigned to HITACHI LTD. (Tokyo). "Method for reducing bias in deep learning classifiers using ensembles" was... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,596, issued on April 21, was assigned to Google LLC (Mountain View, Calif.). "Computer vision models using global and local information" w... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,598, issued on April 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (South Korea). "Weight-sparse neural processing unit with multi-dime... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,599, issued on April 21, was assigned to Tohoku University (Miyagi, Japan). "Driving method of synapse circuit" was invented by Yitao Ma (... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,600, issued on April 21, was assigned to Intel Corp. (Santa Clara, Calif.). "Specialized fixed function hardware for efficient convolution... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,601, issued on April 21, was assigned to Oracle International Corp. (Redwood Shores, Calif.). "Statistical confidence metric for reconstru... और पढ़ें
ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,602, issued on April 21, was assigned to HYUNDAI MOBIS Co. LTD. (Seoul, South Korea). "Device and method for defect inspection based on ex... और पढ़ें